Search by keyword: "interference pattern"
Laser Interferometer in Parabolic Surface Monitoring
| Authors: Timashova L.N., Kulakova N.N. | Published: 19.06.2024 |
| Published in issue: #2(147)/2024 | |
| DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Optical and Optoelectronic Instruments and Complexes | |
| Keywords: interferometer, interference pattern, interference fringe, translucent plane-parallel plate, plane mirror, matrix radiation detector, wave front, laser | |
Interference Method in Controlling the Convex Hyperbolic Surfaces using the Optical Diffraction Element
| Authors: Krasnov D.I., Nguyen X.C., Druzhin V.V. | Published: 28.12.2022 |
| Published in issue: #4(141)/2022 | |
| DOI: 10.18698/0236-3933-2022-4-80-91 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instrumentation and Methods to Control Environment, Substances, Materials, and Products | |
| Keywords: interference pattern, hyperbolic surface, shape control, diffraction element, phase profile, Fizeau interferometer | |
Analysis of Interferometer with Micro-Mirror on Beam Splitting Cube
| Authors: Timashova L.N., Kulakova N.N. | Published: 11.09.2021 |
| Published in issue: #3(136)/2021 | |
| DOI: 10.18698/0236-3933-2021-3-129-143 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Optical and Optoelectronic Instruments and Complexes | |
| Keywords: interferometer, interference pattern, fringe, cube-prism, spherical mirror, matrix radiation detector, wavefront, defocusing, laser | |
Interferometer to Control Wedge Angles
| Authors: Timashova L.N., Kulakova N.N. | Published: 06.06.2020 |
| Published in issue: #2(131)/2020 | |
| DOI: 10.18698/0236-3933-2020-2-117-129 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Optical and Optoelectronic Instruments and Complexes | |
| Keywords: optical wedge, planar wafer, interferometer, interference pattern, interference fringe, optoelectronic system, objective lens, image sensor, measurement error, laser | |