MainCatalogInstrument Engineering, Metrology, Information-Measuring Instruments and SystemsDesign and Instrument Engineering Technology and Electronic Equipment
Direct Process Control of Thin Film Synthesis During Production of Very-Large-Scale Integrated Circuits
| Authors: Obraztsov D.V., Chernyshov V.N., Shakhnov V.A. | Published: 28.11.2017 |
| Published in issue: #6(117)/2017 | |
| DOI: 10.18698/0236-3933-2017-6-17-27 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Design and Instrument Engineering Technology and Electronic Equipment | |
| Keywords: thin films, vacuum deposition, direct control, production, very-large-scale integrated circuit | |
Investigating Electromagnetic Processes in a Brushless Direct Current Motor with the Winding Commutated by Means of Тwo Transistors or Thyristors
Non-Contacting DC Current Motor with Coil Switching by Two Transistors
| Authors: Gridin V.M. | Published: 02.08.2017 |
| Published in issue: #4(115)/2017 | |
| DOI: 10.18698/0236-3933-2017-4-54-63 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Design and Instrument Engineering Technology and Electronic Equipment | |
| Keywords: two-section toroidal coil, inductor, number of poles, specific torque, torque pulsation | |
Silver Films Deposited by Electron-Beam Evaporation for Application in Nanoplasmonics
| Authors: Baburin A.S., Gabidullin A.R., Zverev A.V., Rodionov I.A., Ryzhikov I.A., Panfilov Yu.V. | Published: 06.12.2016 |
| Published in issue: #6(111)/2016 | |
| DOI: 10.18698/0236-3933-2016-6-4-14 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Design and Instrument Engineering Technology and Electronic Equipment | |
| Keywords: silver thin film, single crystal, plasmonics, growth models, electron beam evaporation | |
Research into characteristics and methods of resist coating by infrared spectral ellipsometry
| Authors: Makeev M.O., Zverev A.V., Rodionov I.A. | Published: 23.12.2015 |
| Published in issue: #6(105)/2015 | |
| DOI: 10.18698/0236-3933-2015-6-125-134 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Design and Instrument Engineering Technology and Electronic Equipment | |
| Keywords: microelectronic devices, lithography, ultraviolet resist, centrifuge process, infrared spectral ellipsometry, layer thickness, optical constants | |
Differential evaluation coefficients of technological effectiveness of electronic facilities and their implementation for structural and functional modeling of productive systems
| Authors: Adamov A.P., Adamova A.A., Vlasov A.I. | Published: 12.10.2015 |
| Published in issue: #5(104)/2015 | |
| DOI: 10.18698/0236-3933-2015-5-109-123 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Design and Instrument Engineering Technology and Electronic Equipment | |
| Keywords: visual model, productive system, technological preproduction, technological effectiveness, electronic equipment, system analysis | |
Technical and Economic Assessment Method for the Effectiveness of Technological Processes and Robotic Complexes Structures for Electronic Modules Assemblage within Multinomenclature Production
| Authors: Ivanov Yu.V. | Published: 14.04.2015 |
| Published in issue: #2(101)/2015 | |
| DOI: 10.18698/0236-3933-2015-2-58-70 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Design and Instrument Engineering Technology and Electronic Equipment | |
| Keywords: efficiency, complexity, capacity, cost | |