MainCatalogInstrument Engineering, Metrology, Information-Measuring Instruments and SystemsMetrology and Measurement Assurance
The Semi-Markov Model Process of Operation Primary Measuring Transducers of Complexes with the Possibility of Carrying out Their Checks in Different Ways
| Authors: Kuvykin Yu.А., Minagureev N.A., Suprunyuk V.V., Khayrullin R.Z. | Published: 21.01.2026 |
| Published in issue: #4(153)/2025 | |
| DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Metrology and Measurement Assurance | |
| Keywords: semi-Markov model, measuring equipment, verification, availability coefficient, reliability coefficient, transition probability matrix | |
Metrological Dependability Indicators Analysis of the Glass Capillary Reference Viscometers
| Authors: Neklyudova A.A., Sulaberidze V.Sh. | Published: 02.04.2024 |
| Published in issue: #1(146)/2024 | |
| DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Metrology and Measurement Assurance | |
| Keywords: kinematic viscosity, glass capillary viscometer, conversion factor, metrological reliability, failure-free operation probability, time between failures, service life | |
Simulation Model of an Adaptive Control System for a Segmented Deformable Mirror in a Space Telescope and its Metrological Certification
| Authors: Sychev V.V., Klem A.I. | Published: 29.03.2021 |
| Published in issue: #1(134)/2021 | |
| DOI: 10.18698/0236-3933-2021-1-14-32 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Metrology and Measurement Assurance | |
| Keywords: adaptive control system, permanent magnet synchronous machine, simulation model, metrological certification, error of inadequacy | |
Information and Metrology-Driven Optimisation of Wavefront Error in Telescope-Detected Radiation
| Authors: Sychev V.V., Klem A.I. | Published: 10.09.2020 |
| Published in issue: #3(132)/2020 | |
| DOI: 10.18698/0236-3933-2020-3-37-51 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Metrology and Measurement Assurance | |
| Keywords: aberration computation, optical system, Millimetron space telescope, wavefront, image quality | |
Determining Causality Criteria for Estimating Increases in Measurement Uncertainty as a Result of Solving Systems of Equations
| Authors: Savenkov A.P. | Published: 16.02.2019 |
| Published in issue: #1(124)/2019 | |
| DOI: 10.18698/0236-3933-2019-1-20-34 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Metrology and Measurement Assurance | |
| Keywords: measurement, criterion, causality, surface tension, error, system of equations | |