| Authors: Semenov S.P., Batin S.A., Vertyanov D.V., Zhumagali R.N., Kochergin M.D., Timoshenkov S.P. |
Published: 12.08.2026 |
| Published in issue: #2(155)/2026 |
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| DOI: |
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| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Electronic Component Base of Micro- and Nanoelectronics, Quantum Devices |
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Keywords: system in package, three-dimensional packaging, vias, mold compound, chip package substrate, signal integrity, S-parameters, impedance
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