MainCatalogInstrument Engineering, Metrology, Information-Measuring Instruments and Systems All articles
Low elevation measurements using phase method in the presence of interference
Authors: Profatilova G.A., Soloviev G.N. | Published: 16.05.2013 |
Published in issue: #1(90)/2013 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: phase method, low elevation measurement, interference, phase finding, synthesis of phase centers, accuracy of low elevation measurements |
Technology of Manufacturing of Diffraction and Hologram Optical Parts with Functional Microrelief of Surface by Method of Plasmochemical Etching
Authors: Odinokov S.B., Sagatelyan G.R. | Published: 31.10.2013 |
Published in issue: #2(79)/2010 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Telecommunication Systems, Networks and Devices | |
Keywords: computer holography, diffraction optical components, plasmochemistry, optical glass |
Technology of Manufacturing of Diffraction and Hologram Optical Parts with Functional Microrelief of Surface by Method of Plasmochemical Etching
Authors: Odinokov S.B., Sagatelyan G.R. | Published: 31.10.2013 |
Published in issue: #2(79)/2010 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Telecommunication Systems, Networks and Devices | |
Keywords: computer holography, diffraction optical components, plasmochemistry, optical glass |
Features of Signal Processing in the Absorption Gas Analyzer when Measuring Low Concentrations
Authors: Suvorov S.V. | Published: 08.02.2015 |
Published in issue: #1(100)/2015 | |
DOI: 10.18698/0236-3933-2015-1-3-12 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: absorbing gas analysis, signal, peculiarities |
Cancellation of dimension of input realization vectors in neural net circuits of signal processing in short-range detection systems
Authors: Khokhlov V.K., Gromova E.V. | Published: 04.04.2015 |
Published in issue: #4(37)/1999 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: |
Threshold of signal detection at parametric spectral estimation
Authors: Soloviev A.G.  | Published: 04.04.2015 |
Published in issue: #4(37)/1999 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: |
Filtration of interferences during analog-to-digital conversion
Authors: Kalinin А.V. | Published: 04.04.2015 |
Published in issue: #4(37)/1999 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: |
Influence of acoustic-optical processor errors on accuracy of digital processing of wide-band signals
Authors: Odinokov S.B., Borisov M.V., Martyanov А.N., Novikov A.A. | Published: 04.04.2015 |
Published in issue: #4(37)/1999 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: |
Optimal space-time signal processing effected by narrow band stationary correlated Gaussian interference
Authors: Gelesev A.I. | Published: 04.04.2015 |
Published in issue: #4(37)/1999 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: |
Dynamics of noisy images recognition by neural system on the basis of large optical-electronic vector-matrix multiplier
Authors: Gunko M.V., Rozhkov O.V. | Published: 13.04.2015 |
Published in issue: #3(35)/1999 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Optical and Optoelectronic Instruments and Complexes | |
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