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On the Issue of the Intense Electron Flow Scattering on Residual Gas Molecules in the O-type Microwave EVD
| Authors: Cherchenko D.K., Komarov D.A., Yakushkin E.P. | Published: 02.10.2024 |
| Published in issue: #3(148)/2024 | |
| DOI: | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Vacuum and Plasma Electronics | |
| Keywords: klystron, scattering, micro-wave EVD, mass spectrometry, electron flow | |