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On the Issue of the Intense Electron Flow Scattering on Residual Gas Molecules in the O-type Microwave EVD

Authors: Cherchenko D.K., Komarov D.A., Yakushkin E.P. Published: 02.10.2024
Published in issue: #3(148)/2024  
DOI:

 
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Vacuum and Plasma Electronics  
Keywords: klystron, scattering, micro-wave EVD, mass spectrometry, electron flow

Abstract

The paper presents solution to the problem of intense focused electron beam scattering on residual gas molecules in the O-type microwave electrovacuum devises (EVD). The solution could be introduced in computation with any set of the system input parameters. The paper provides results of numerical simulation of the electron beam scattering processes for the KU-329B powerful continuous klystron used in the satellite communication systems, as well as results of this device mass-spectrometric study, which analysis makes it possible to determine a set of the computation input parameters. The obtained values of the root-mean-square deviation of the boundary electron were verified by the klystron experimental study on the thermal vacuum treatment and dynamic testing benches. Results of the obtained data analysis revealed causes of the device instability characterized by the effect of the operation modes disruption in dynamic testing. Consequently, the need was identified to introduce a criterion for estimating the pressure level required in the device vacuum volume from the point of view of the electron beam maximum permissible scattering. Compliance with this criterion requirements is important in the powerful devices, where even minimum values of current deposition on the transport channel internal surfaces are unacceptable. This criterion was used to compute the pressure permissible value in the KU-329B device volume. Technology of its thermal vacuum treatment was modernized making it possible to significantly reduce the overall manufacture time

Please cite this article in English as:

Cherchenko D.K., Komarov D.A., Yakushkin E.P. On the issue of the intense electron flow scattering on residual gas molecules in the O-type microwave EVD. Herald of the Bauman Moscow State Technical University, Series Instrument Engineering, 2024, no. 3 (148), pp. 59--74 (in Russ.). EDN: IZAMCX

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