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Analysis of MOSFET Transfer Characteristics Shear
| Authors: Drach V.E. | Published: 14.02.2017 |
| Published in issue: #1(112)/2017 | |
| DOI: 10.18698/0236-3933-2017-1-4-15 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
| Keywords: MOSFET, charge degradation, Fowler - Nordheim injection, linear region, subthreshold region | |