Search by keyword: "tangled logic structures (TLS)"
VLSI Circuit Detection Through Tangled Logic Structures
| Authors: Kuzovlev V.I., Ivanova N.A. | Published: 12.08.2016 |
| Published in issue: #4(109)/2016 | |
| DOI: 10.18698/0236-3933-2016-4-4-18 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
| Keywords: very-large-scale integration (VLSI), tangled logic structures (TLS), functional circuit analysis | |