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Infrared thermography methods of assessing temperature effect on reliability of electronic equipment
| Authors: Semencov S.G., Gridnev V.N., Sergeeva N.A. | Published: 19.02.2016 |
| Published in issue: #1(106)/2016 | |
| DOI: 10.18698/0236-3933-2016-1-3-14 | |
| Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instrumentation and Methods to Control Environment, Substances, Materials, and Products | |
| Keywords: thermal imaging, infrared thermography, latent defects, parametric failures | |