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One-dimentional statistical characteristics of binary random phase mask in the far-field diffraction pattern
| Authors: Kolesnikov M.V., Trofimov N.E. | Published: 12.10.2015 |
| Published in issue: #5(104)/2015 | |
| DOI: 10.18698/0236-3933-2015-5-97-108 | |
| Category: Informatics, Computer Engineering and Control | Chapter: Methods and Systems of Information Protection, Information Security | |
| Keywords: binary random phase masks, optical Fourier transform, probability density, complex amplitude, random field | |