All articles by "Zverev A.V."
Silver Films Deposited by Electron-Beam Evaporation for Application in Nanoplasmonics
Authors: Baburin A.S., Gabidullin A.R., Zverev A.V., Rodionov I.A., Ryzhikov I.A., Panfilov Yu.V. | Published: 06.12.2016 |
Published in issue: #6(111)/2016 | |
DOI: 10.18698/0236-3933-2016-6-4-14 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Design and Instrument Engineering Technology and Electronic Equipment | |
Keywords: silver thin film, single crystal, plasmonics, growth models, electron beam evaporation |
Research into characteristics and methods of resist coating by infrared spectral ellipsometry
Authors: Makeev M.O., Zverev A.V., Rodionov I.A. | Published: 23.12.2015 |
Published in issue: #6(105)/2015 | |
DOI: 10.18698/0236-3933-2015-6-125-134 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Design and Instrument Engineering Technology and Electronic Equipment | |
Keywords: microelectronic devices, lithography, ultraviolet resist, centrifuge process, infrared spectral ellipsometry, layer thickness, optical constants |