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В.И. Кузовлев, Н.А. Иванова

18

ISSN 0236-3933. Вестник МГТУ им. Н.Э. Баумана. Сер. Приборостроение. 2016. № 4

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Kuzovlev V.I.

— Cand. Sci. (Eng.), Assoc. Professor of Information Control Systems

Department, Bauman Moscow State Technical University (2-ya Baumanskaya ul. 5, Moscow,

105005 Russian Federation).

Ivanova N.A.

— Research Scientist, Institute of Nanotechnology and Microelectronics,

Russian Academy of Sciences (Leninskiy prospekt 32A, Moscow, 119991 Russian Federation);

post-graduate student, Bauman Moscow State Technical University (2-ya Baumanskaya ul. 5,

Moscow, 105005 Russian Federation).

Please cite this article in English as:

Kuzovlev V.I., Ivanova N.A. VLSI Circuit Detection Through Tangled Logic Structures.

Vestn.

Mosk. Gos. Tekh. Univ. im. N.E. Baumana, Priborostr.

[Herald of the Bauman Moscow State

Tech. Univ., Instrum. Eng.], 2016, no. 4, pp. 4–18. DOI: 10.18698/0236-3933-2016-4-4-18