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Up-to-date interferrometric ellipsometer

Authors: Lysenko G.A., Pechkin D.Yu., Pogodaev V.V. Published: 13.04.2015
Published in issue: #3(35)/1999  
DOI:

 
Category: Laser and opto-electronic systems  
Keywords:

Layout of the up-to-date interferrometric ellipsometer is proposed. The analysis of measurement error components of a phase difference between interference signals, is performed. The obtained relations allow to calculate an error at known characteristics and operation mode of the ellipsometer units; to optimise operating conditions of these units to achieve a minimum error; to determine the required technical features and operation mode to achieve a prescribed error. Experimental results confirming the obtained dependencies are presented.