Up-to-date interferrometric ellipsometer
Authors: Lysenko G.A., Pechkin D.Yu., Pogodaev V.V. | Published: 13.04.2015 |
Published in issue: #3(35)/1999 | |
DOI: | |
Category: Laser and opto-electronic systems | |
Keywords: |
Layout of the up-to-date interferrometric ellipsometer is proposed. The analysis of measurement error components of a phase difference between interference signals, is performed. The obtained relations allow to calculate an error at known characteristics and operation mode of the ellipsometer units; to optimise operating conditions of these units to achieve a minimum error; to determine the required technical features and operation mode to achieve a prescribed error. Experimental results confirming the obtained dependencies are presented.