All articles by "Paliy V.I."
Statistical Analysis of the Technological Processes Downtime Distribution in Manufacturing Prototypes of Devices on the Example of a Radio Assembly Shop
Authors: Paliy V.I., Vantsov S.V. | Published: 25.06.2023 |
Published in issue: #2(143)/2023 | |
DOI: 10.18698/0236-3933-2023-2-39-50 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Design and Instrument Engineering Technology and Electronic Equipment | |
Keywords: design and development, proto-type, instrument, technological process, incidents, downtime, statistical analysis, regression model |