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Developing a Model to Describe the Retroreflection Phase Function in Infrared Optoelectronic Devices

Authors: Baryshnikov N.V., Stepanov R.O., Lebedev V.A. Published: 16.02.2019
Published in issue: #1(124)/2019  
DOI: 10.18698/0236-3933-2019-1-4-19

 
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Optical and Optoelectronic Instruments and Complexes  
Keywords: retroreflection properties, retroreflection phase function, retroreflection index, infrared equipment

The paper presents a technique for modelling the retroreflection phase function in infrared optoelectronic devices by employing known fitting functions. The model takes into account the specifics of operating in the infrared range of the electromagnetic spectrum. We performed a comparative analysis of various fitting functions. We propose a method for computing retroreflection index as analytic functions, which uses the main infrared equipment specification data

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