Opto-Electronic System for Measurment of Spherical Aberration

Authors: Timashova L.N., Kulakova N.N., Sazonov V.N. Published: 07.12.2018
Published in issue: #6(123)/2018  
DOI: 10.18698/0236-3933-2018-6-112-122

Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Optical and Optoelectronic Instruments and Complexes  
Keywords: spherical aberration, opto-electronic system, lens, matrix radiation receiver, measurement error, the signal-noise relation, the threshold illumination, laser, diaphragm

An opto-electronic system for measurement of spherical aberration of a lens was investigated. The article presents the functional scheme for registration of interferential pattern affected by spherical aberration on the matrix radiation receiver. Unlike the Сotton --- Linnik method, application of the opto-electronic system allows us to increase the accuracy and efficiency of the measurements. The approach spreads the range of controlled products and eliminates the errors caused by the individual aspects of a human sight. The formulas for dimensional and energy calculations of the opto-electronic system and for the suitability estimation of the application of the chosen matrix radiation receiver are presented. As an example, the dimensional and energy calculations of the system for controlled lens with the focal length f' = 100 mm. The formula for calculation of measurement error of wave aberration using opto-electronic system based on compact He--Ne-laser as the radiation source is given. The error in the example given is 0,1λ (λ= 0,6328 µm). The formula for transition from wave aberration related to the comparison sphere coincident with the Gauss plain into transversal spherical aberration is presented. The application of the presented formula resulted 3...5 times less error of measurements of spherical aberration of the lens using the matrix radiation receiver than the error of the same experiment occurring in case of Cotton --- Linnik method's application


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