|

Petzval Lens with Extended Spectral Range for Registering Interference Patterns in the Infrared Fourier Spectrometer

Authors: Kulakova N.N., Permyakov I.A., Tyshkunov N.V. Published: 17.06.2015
Published in issue: #3(102)/2015  
DOI: 10.18698/0236-3933-2015-3-116-126

 
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instrumentation and Methods to Transform Images and Sound  
Keywords: remote sensing of the Earth, spectrometer, Fourier spectrometer, Petzval lens

The article presents calculation of parameters of the Petzval lens with an extended spectral range for registering interference patterns in a working branch of the infrared Fourier spectrometer. It introduces the current application domain of these devices. Some advantages of the devices in comparison with the classical spectral instruments (prismatic and diffraction) are listed. A schematic optical diagram ofthe infrared Fourier spectrometer is described. Some essential relations describing the Fourier spectroscopy technique are given. The appropriate conclusions are drawn. The basic lens of a recording branch in the infrared Fourier spectrometer IRFS-3 was analyzed. The article discusses the results of size and aberration calculations of the Petzval lens parameters with an extended spectral range, which can improve the instrument accuracy. An improved scheme of the infrared Fourier spectrometer with the lens featuring the calculated parameters is suggested. Primary advantages of the new scheme are specified in comparison with the original one.

References

[1] Arkhipov S.A., Oreshkin A.P., Titov E.I. Doklady nauchn.-tekhn. konf. "Giperspektral’nye pribory I tekhnologii" [Proceedings of the Scientific and Technical Conference "Hyperspectral Instruments and Technology]. Sb. Tezisov [Abstracts]. Krasnogorsk, OAO "Krasnogorskiy zavod im. S.A. Zvereva", 2013. 145 p.

[2] Kolomiytsev Yu.V. Interferometry [Interferometers]. Leningrad, Mashinostroenie Publ., 1976. 296 p.

[3] Tarasevich B.N. Osnovy IK-spektroskopii s preobrazovaniem Fur’e [Basics of IR spectroscopy with Fourier Transform]. Moscow, MGU im. Lomonosova Publ., 2012. 22 p.

[4] Mosyagin G.M., Nemtinov V.B., Lebedev E.N. Teoriya optiko-elektronnykh system [The Theory of Electro-Optical Systems]. Moscow, Mashinostroenie Publ., 1990. 432 p.

[5] Zakaznov N.P., Kiryushin S.I., Kuzichev V.I. Teoriya opticheskikh system [The Theory of Optical Systems]. Moscow, Mashinostroenie Publ., 1992. 448 p.

[6] Slyusarev G.G. Raschet opticheskikh system [Calculation of Optical Systems]. Leningrad, Mashinostroenie Publ., 1975. 671 p.

[7] Rusinov M.M., Grammatin A.P., Ivanov P.D. Vychislitel’naya optika. Spravochnik [Computational Optics. Handbook]. Moscow, Librokom Publ., 2009. 424 p.

[8] Zverev V.A., Krivopustova E.V., Tochilina T.V. Opticheskie materialy. Ch. 2 [Optical Materials. Part 2.]. St. Petersberg, NIUITMO Publ., 2013. 248 p.

[9] Novitskiy L.A., Stepanov B.M. Opticheskie svoystva materialov pri nizkikh temperaturakh [Material Optical Properties at Low Temperatures]. Moscow, Mashinostroenie Publ., 1980. 271 p.

[10] Askochenskiy A.A. Opticheskie materialy dlya infrakrasnoy tekhniki [Optical Materials for Infrared Technology]. Moscow, Mashinostroenie Publ., 1995. 310 p.